Texture analysis of melt-spun Ni-Mn-Ga tapes by means of electron backscatter diffraction (EBSD)

Electron Backscatter Diffraction (EBSD) Technique and Materials Characterization Examples

The term “electron backscatter diffraction” (EBSD) is now synonymous with both the scanning electron microscope (SEM) technique and the accessory system that can be attached to an SEM. EBSD provides quantitative microstructural information about the crystallographic nature of metals, minerals, semiconductors, and ceramics—in fact most inorganic crystalline materials. It reveals grain size, grai...

Textural analysis of a microcrystalline quartz using X-Ray and Electron Backscatter Diffraction (EBSD) techniques

An unusual microcrystalline quartz texture has been recognized in the investigation of pervasively silicified ore-bearing horizons occurring in the uppermost part of carbonate platform sequences of different ages (from Precambrian to Mesozoic) and of different geotectonic settings. This peculiar texture has been labeled “grid-work texture”, and derives only by a rather fast and preferred crysta...

Possibilities and Limits of Phase Identification by Electron Backscatter Diffraction (EBSD) in the SEM

Crystallographic preferred orientations analysis of quartz crystals in Psammite using electron backscatter diffraction,western Ireland

The present study investigates the crystal preferred orientation (CPO) of quartz crystals in psammitic rocks to ascertain the deformationmechanism using electron backscatter diffraction (EBSD) on quartz crystals from north of the Renvyle-Bofin Slide (RBS) nearLetterfrack in western Ireland. Complete crystallographic orientations were determined for several thousand individual quartz crystalsin ...

Texture-dependent Measurement of Recrystallization Kinetics Using Electron Backscatter Diffraction

Partially recrystallized samples of 5352 aluminum alloy and pure titanium were sectioned and characterized with automated electron backscatter diffraction (EBSD) in a scanning electron microscope. Pixels were partitioned into recrystallized (annealed state) and unrecrystallized (deformed state) using a criterion based on the confidence index (CI) and the diffraction pattern quality (IQ). Unrecr...